TIT# Complete SAXS data analysis and synthesis of lamellar
     two-phase systems. Deduction of a simple model for the layer
     statistics
AUT# Stribeck, N.
SOU# J. Phys. IV (1993), 3(C8), 507-10
LOC# xv017  @selbst.ftx
CLA#
COM#
APP#
MAT#
ABS# A structural model for the analysis of small-angle x-ray scattering
     (SAXS) data from lamellar two-phase systems is proposed and applied
     on data sets from three injection-molded poly(ethylene
     terephthalate) (PET) samples.  The concept of data analysis is based on
     Ruland's interface distribution function (IDF).  The suggested model
     is defined by few parameters of physical meaning.  It unifies the well
     known concepts of an ensemble of nonuniform stacks, finite stack
     height and one-dimensional paracrystalline disorder in an analysis
     expression.  In order to deduce this expression, the notion of an
     inhomogeneous structure within the sample is mathematical treated in terms
     of "compansion", a general superposition principle.  Its mathematical
     equivalent in one dimension is the Mellin convolution.  The theory of
     the Mellin convolution may be used to find analysis functions even for
     the convoluted.  An example is given, which in future work may be
     used to describe the thickness distributions of amorphous and crystalline
     layers.  In the application part of this study Gaussians are used to
     describe the thickness distributions in each local stack.  The
     introduction of compansion adds one extra parameter, which describes
     the heterogeneity of the sample.  Compansion makes the global
     thickness distributions become more asym.