TIT# Influence of the Blend Compatibility on the Morphology of Thin Polymer
     Blend Films
AUT# Gutmann, J. S.; Müller-Buschbaum, P.; Schubert, D. W.; Stribeck, N.;
     Stamm, M.
SOU# J. Macromol. Sci., Part B: Polym. Phys. (1999), B38(5), 563-576
LOC# xv052
CLA#
COM# scattering, scanning force microscopy
APP#
MAT#
ABS# Thin films of incompatible polymer blends can form a variety of structures
     on preparation. For the polymer blend system consisting of two
     poly(styrene-co-para-bromo-styrene)s at different degrees of bromination,
     $PBr_xS/PBr_yS$, the compatibility can be tuned through a variation of the
     difference in the degree of bromination. Within this blend system, two
     series of samples with different compatibilities were investigated at
     various blend compositions. The surface morphology of the thin films was
     investigated by atomic force microscopy (AFM) measurements, while diffuse
     X-ray scattering provided additional depth sensitivity at a comparable
     lateral resolution. The results are indicative for phase separation
     lateral, as well as perpendicular, to the sample surface.