TIT# Roughness correlations in ultra-thin polymer blend films
AUT# Gutmann, J. S.; Müller-Buschbaum, P.; Schubert, D. W.; Stribeck, N.;
     Smilgies, D.; Stamm, M.;
SOU# Physica B (2000), 283, 40-44
LOC# xv054
CLA#
COM#
APP#
MAT#
ABS# Ultra-thin films of weakly incompatible polymer blends form smooth films
     with correlated interfaces upon suitable preparation. With the
     poly(styrene-co-para-bromo-styrene) $PBr_{0.91}S/PBr_{0.67}S$ blend
     system, of slightly differend degrees of bromination, a series of samples
     with varying composition on top of roughened substrates has been
     investigated. The surface morphology of the thin films was characterized
     by microscopy measurements, while with diffuse X-ray scattering the
     roughness correlation between the interfaces was examined. A lower
     cut-off length of the replicated roughness spectrum at small dimensions
     was obtained. Our results show that the blend composition has a
     distinct influence on the replicated in-plane lengths.