IT# Tomographic small-angle x-ray scattering
AUT# Feldkamp, J. M.; Kuhlmann, M.; Roth, S. V.; Timmann, A.; Gehrke, R.;
     Stribeck, N.; Shakhverdova, I.; Paufler, P.; Schroer, C. G.;
SOU# Phys. Stat. Sol. (2009), submitted 24 Sept 2008
LOC# xv120 @ xv120sub.pdf
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COM#
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ABS# Small-angle X-ray scattering (SAXS) has become a standard technique
     for the investigation of nanostructured materials with applications in
     many fields of science. In many cases the structure of a specimen is not
     homogeneous on a macroscopic scale. For these kinds of samples, scanning
     tomography provides additional real-space information. Using
     SAXS-tomography, the distribution of the nanostructure can be studied
     at each location on a virtual section through the sample. The real-space
     resolution is determined by the lateral size of the X-ray beam.